Variation-Aware Fault Modeling
Author:
Affiliation:
1. Fraunhofer IIS/EAS, Dresden, Germany
2. Univ. of Freiburg, Freiburg, Germany
3. Univ. of Paderborn, Paderborn, Germany
4. Univ. of Passau, Passau, Germany
5. Univ. of Stuttgart, Stuttgart, Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/5689827/5692210/05692228.pdf?arnumber=5692228
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Variation-Aware Defect Characterization at Cell Level;2020 IEEE European Test Symposium (ETS);2020-05
2. Retraction:Reliability assurance in early-life-failure test through improved nearest neighbor regression;IEICE Electronics Express;2020
3. Towards Simulation Based Evaluation of Safety Goal Violations in Automotive Systems;Lecture Notes in Electrical Engineering;2015-12-12
4. Efficient Variation-Aware Delay Fault Simulation Methodology for Resistive Open and Bridge Defects;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2014-05
5. SAT-Based Analysis of Sensitizable Paths;IEEE Design & Test;2013-08
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