Author:
Czutro A.,Polian I.,Lewis M.,Engelke P.,Reddy S.M.,Becker B.
Cited by
18 articles.
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1. Generation of Two-Cycle Tests for Structurally Similar Circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-02
2. Neural Fault Analysis for SAT-based ATPG;2022 IEEE International Test Conference (ITC);2022-09
3. Maintaining Scalability of Test Generation Using Multicore Shared Memory Systems;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2020-02
4. An Efficient SAT-Based Test Generation Algorithm with GPU Accelerator;Journal of Electronic Testing;2018-08-30
5. An Accelerating Technique for SAT-based ATPG;IPSJ Transactions on System LSI Design Methodology;2017