High-Accuracy Calibration for a Multiview Microscopic 3-D Measurement System-Reference-Cited by-同舟云学术

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High-Accuracy Calibration for a Multiview Microscopic 3-D Measurement System

Published:2024 Issue: Volume: Page:1-12
ISSN:1083-4435
Container-title:IEEE/ASME Transactions on Mechatronics
language:
Short-container-title:IEEE/ASME Trans. Mechatron.

Author:

Dai Rong¹^ORCID,Li Wenpan²^ORCID,Tang Xueyan²,Li Yucheng³^ORCID,Liu Yun-Hui¹^ORCID

Affiliation:

1. T Stone Robotics Institute and Department of Mechanical and Automation Engineering, The Chinese University of Hong Kong, Shatin, Hong Kong, China

2. Hong Kong Centre for Logistics Robotics, Shatin, Hong Kong, China

3. CUHK Hong Kong Innovation and Technology Research Institute (Futian), ShenZhen, China

Funder

Shenzhen-Hong Kong Science and Technology Innovation Cooperation Zone

RGC

InnoHk via the Hong Kong Centre for Logistics Robotics

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/3516/4785241/10358363.pdf?arnumber=10358363

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