High-Accuracy Calibration of High-Speed Fringe Projection Profilometry Using a Checkerboard-Reference-Cited by-同舟云学术

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High-Accuracy Calibration of High-Speed Fringe Projection Profilometry Using a Checkerboard

Published:2022-10 Issue:5 Volume:27 Page:4199-4204
ISSN:1083-4435
Container-title:IEEE/ASME Transactions on Mechatronics
language:
Short-container-title:IEEE/ASME Trans. Mechatron.

Author:

Wang Jian¹^ORCID,Zhang Zonghua²^ORCID,Lu Wenlong¹^ORCID,Jiang Xiangqian Jane³^ORCID

Affiliation:

1. State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China

2. School of Mechanical Engineering, Hebei University of Technology, Tianjin, P.R. China

3. EPSRC Future Metrology Hub, University of Huddersfield, Huddersfield, U.K.

Funder

National Natural Science Foundation of China

Natural Science Foundation of Hubei Province

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/3516/9924619/09684240.pdf?arnumber=9684240

Reference26 articles.

1. High accuracy 3D calibration method of phase calculation-based fringe projection system by using LCD screen considering refraction error

2. Flexible and high-accuracy method for uni-directional structured light system calibration

3. Calibration of fringe projection profilometry using an inaccurate 2D reference target

4. Micro Fourier Transform Profilometry (μFTP): 3D shape measurement at 10,000 frames per second

5. Projector distortion residual compensation in fringe projection system

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1. Deep-learning-enabled single-shot high-frequency color fringe projection profilometry based on dual inner shifting-phase method;Measurement;2025-01

2. Quasi-calibration method for structured light system with auxiliary camera;Optics & Laser Technology;2024-12

3. Deep learning in fringe projection: A review;Neurocomputing;2024-05

4. Improved Phase-Shifting Profilometry for Non-Constant Light Intensity Environments;IEEE Sensors Journal;2024-04-15

5. An Accurate Calibration Method for Multilayer Refractive Imaging in Underwater 3-D Scanning;IEEE/ASME Transactions on Mechatronics;2024

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