Early SEU fault injection in digital, analog and mixed signal circuits: a global flow-Reference-Cited by-同舟云学术

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Early SEU fault injection in digital, analog and mixed signal circuits: a global flow

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Container-title:Proceedings Design, Automation and Test in Europe Conference and Exhibition
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Author:

Leveugle R.,Ammari A.

Publisher

IEEE Comput. Soc

Link

http://xplorestaging.ieee.org/ielx5/8959/28390/01268909.pdf?arnumber=1268909

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of All Solid State Nanosecond Pulse Transformer Fault Detection Device Based on Marx Circuit;Journal of Physics: Conference Series;2024-07-01

2. Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-01

3. The Challenges of Coupling Digital-Twins with Multiple Classes of Faults;2022 IEEE 23rd Latin American Test Symposium (LATS);2022-09-05

4. Assessing SET Sensitivity of Mixed-Signal Circuits at Early Design Stages;2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS);2019-11

5. Fault Analysis in Analog Circuits Through Language Manipulation and Abstraction;Lecture Notes in Electrical Engineering;2018-12-20

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