Minimization of NBTI performance degradation using internal node control
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx5/4926138/5090609/05090649.pdf?arnumber=5090649
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. GNN-Based INC and IVC Co-Optimization for Aging Mitigation;2024 IEEE European Test Symposium (ETS);2024-05-20
2. A meta-heuristic search-based input vector control approach to co-optimize NBTI effect, PBTI effect, and leakage power simultaneously;Microelectronics Reliability;2023-05
3. Transistor Reordering for Electrical Improvement in CMOS Complex Gates;2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2022-08-22
4. Lookup table‐based negative‐bias temperature instability effect and leakage power co‐optimization using genetic algorithm approach;International Journal of Circuit Theory and Applications;2021-05-03
5. Effect of NBTI stress on DSP cores used in CE devices: threat model and performance estimation;IET Computers & Digital Techniques;2018-10-03
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