Author:
Chandrasekar K.,Hsiao M.S.
Cited by
11 articles.
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1. Boolean and Pseudo-Boolean Test Generation for Feedback Bridging Faults;IEEE Transactions on Computers;2016-03-01
2. Property Clustering and Learning Techniques;System-Level Validation;2012-09-25
3. Testability-Driven Statistical Path Selection;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2012-08
4. Effective Robustness Analysis Using Bounded Model Checking Techniques;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2011-08
5. Functional Test Generation Using Efficient Property Clustering and Learning Techniques;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2010-03