Efficient Proximity Probing Algorithms for Metrology
-
Published:2015-01
Issue:1
Volume:12
Page:84-95
-
ISSN:1545-5955
-
Container-title:IEEE Transactions on Automation Science and Engineering
-
language:
-
Short-container-title:IEEE Trans. Automat. Sci. Eng.
Author:
Adler Aviv,Panahi Fatemeh,van der Stappen A. Frank,Goldberg Ken
Funder
U.S. National Science Foundation
Human-Robot Collaborative Systems
Google
Cisco
Flextronics
Netherlands Organization for Scientific Research (NWO)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Control and Systems Engineering