Digitally programmable continuous-time biquad filter in 65-nm CMOS
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3 articles.
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1. Electrical Noise in Deep-Submicron CMOS;Stochastic Process Variation in Deep-Submicron CMOS;2013-11-14
2. Random Process Variation in Deep-Submicron CMOS;Stochastic Process Variation in Deep-Submicron CMOS;2013-11-14
3. Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs;IEEE Transactions on Circuits and Systems I: Regular Papers;2011-01