<tex>$rm Mpi rm log$</tex>, Macromodeling Via Parametric Identification of Logic Gates-Reference-Cited by-同舟云学术

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<tex>$rm Mpi rm log$</tex>, Macromodeling Via Parametric Identification of Logic Gates

Published:2004-02 Issue:1 Volume:27 Page:15-23
ISSN:1521-3323
Container-title:IEEE Transactions on Advanced Packaging
language:en
Short-container-title:IEEE Trans. Adv. Packag.

Author:

Stievano I.S.,Maio I.A.,Canavero F.G.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/6040/28720/01288266.pdf?arnumber=1288266

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