Author:
van Duijsen Peter,Leuchter Jan,Bauer Pavol
Cited by
2 articles.
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1. Automatic test-bench for SiC power devices using LabVIEW;Journal of Electrical Engineering;2024-04-01
2. Practical considerations of SiC technology for UAV;2016 IEEE/AIAA 35th Digital Avionics Systems Conference (DASC);2016-09