Extraction of the Random Component of Time-Dependent Variability Using Matched Pairs-Reference-Cited by-同舟云学术

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Extraction of the Random Component of Time-Dependent Variability Using Matched Pairs

Published:2015-04 Issue:4 Volume:36 Page:300-302
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Kaczer Ben,Franco Jacopo,Roussel Philippe J.,Groeseneken Guido,Chiarella Thomas,Horiguchi Naoto,Grasser Tibor

Funder

imec’s Core Partner Program

European Commission within the FP7/ICT MoRV Project

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/55/7064687/07042778.pdf?arnumber=7042778

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Estudio de Confiabilidad en Diodos Basados en AlGaN/GaN Durante el Estado de Encendido;Revista Politécnica;2022-05-25

2. Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction;2021 IEEE International Reliability Physics Symposium (IRPS);2021-03

3. Reliability Assessment of AlGaN/GaN Schottky Barrier Diodes Under ON-State Stress;IEEE Transactions on Device and Materials Reliability;2020-03

4. Defect-Based Compact Modeling of Random Telegraph Noise;Noise in Nanoscale Semiconductor Devices;2020

5. Statistical Characterization of BTI and RTN using Integrated pMOS Arrays;2019 IEEE International Integrated Reliability Workshop (IIRW);2019-10

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