Effectiveness of Surface Potential Fluctuation for Representing Inversion-Layer Mobility Limited by Coulomb Scattering in MOFETs
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Published:2015-11
Issue:11
Volume:36
Page:1183-1185
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ISSN:0741-3106
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Container-title:IEEE Electron Device Letters
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language:
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Short-container-title:IEEE Electron Device Lett.
Author:
Cai Weili,Takenaka Mitsuru,Takagi Shinichi
Funder
Core Research for Evolutionary Science and Technology, Japan Science and Technology Agency
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials