Classification and identification of nonrobust untestable path delay faults-Reference-Cited by-同舟云学术

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Classification and identification of nonrobust untestable path delay faults

Published:1996 Issue:8 Volume:15 Page:845-853
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Cheng K.-T.,Chen H.-C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx1/43/11089/00511566.pdf?arnumber=511566

Cited by 72 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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