Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
6 articles.
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1. Crystal Characterization;Semiconductor Silicon Crystal Technology;1989
2. Residual damage to an atomically cleaned low‐temperature‐annealed Si(100) surface;Applied Physics Letters;1980-09-15
3. Influence of heat treatment of silicon on minority carrier lifetime;Czechoslovak Journal of Physics;1970-02
4. RADIATIVE RECOMBINATION LIFETIMES IN LASER‐EXCITED SILICON;Applied Physics Letters;1966-02-15
5. Measurement methods, part D;Impurities and Defects in Group IV Elements, IV-IV and III-V Compounds. Part a: Group IV Elements