Author:
Weyuker E.,Goradia T.,Singh A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
146 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Do we need high-order mutation in fault-based Boolean-specification testing?;Journal of Systems and Software;2024-04
2. Spectral Test Generation for Boolean Expressions;International Journal of Software Engineering and Knowledge Engineering;2023-07-12
3. Mutation-Based Minimal Test Suite Generation for Boolean Expressions;International Journal of Software Engineering and Knowledge Engineering;2023-05-17
4. Static detection of equivalent mutants in real-time model-based mutation testing;Empirical Software Engineering;2022-09-20
5. Test suite generation for boolean conditions with equivalence class partitioning;Proceedings of the IEEE/ACM 10th International Conference on Formal Methods in Software Engineering;2022-05-18