Meeting New RF Measurement Challenges: Wide Intermediate-Frequency Millimeter-Wave Modulated Device and Subsystem Characterization and Evolving Measurement Architectures
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Radiation
Link
http://xplorestaging.ieee.org/ielx7/6668/8283882/08283884.pdf?arnumber=8283884
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