Experimental Investigation on the Turn-Off Failure Mechanism of IGCT-Reference-Cited by-同舟云学术

Experimental Investigation on the Turn-Off Failure Mechanism of IGCT

Published:2024-10 Issue:10 Volume:39 Page:13062-13070
ISSN:0885-8993
Container-title:IEEE Transactions on Power Electronics
language:
Short-container-title:IEEE Trans. Power Electron.

Author:

Liu Jiapeng¹^ORCID,Pan Jianhong²^ORCID,Wu Jinpeng²^ORCID,Meng Lingyao³,Liu Fucheng⁴,Zhu Yiying²,Xu Xiaoyu²,Chen Zhengyu²^ORCID,Li Zheng¹,Zeng Rong²^ORCID

Affiliation:

1. Department of Energy and Power Engineering, Tsinghua University, Beijing, China

2. Department of Electrical Engineering, Tsinghua University, Beijing, China

3. School of Integrated Circuits, Tsinghua University, Beijing, China

4. School of Materials Science and Engineering, Tsinghua University, Beijing, China

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/63/10659244/10559455.pdf?arnumber=10559455

Reference16 articles.

1. A More Prospective Look at IGCT: Uncovering a Promising Choice for dc Grids

2. Design and test of the bidirectional solid-state switch for an 160kV/9kA hybrid DC circuit breaker

3. The Destruction Mechanism in GCTs

4. Turn-off failure mechanism in large area IGCTs

5. Parameters influencing the maximum controllable current in gate commutated thyristors

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