Loss Characterization and Modeling of Class II Multilayer Ceramic Capacitors: A Synergistic Material-Microstructure-Device Approach
Author:
Affiliation:
1. Electrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, U.K.
2. Danfoss Silicon Power R&D Munich, Ismaning, Germany
3. Picotest, Phoenix, AZ, USA
Funder
Engineering and Physical Sciences Research Council
Jardine Foundation
Cambridge Trust
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/63/10261408/10153936.pdf?arnumber=10153936
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3. Methodology for Large-signal Loss Characterization of Ferroelectric Class II MLCC in High-frequency Range
4. Measurement of Large-Signal C OSS and C OSS Losses of Transistors Based on Nonlinear Resonance
5. Modeling ceramic capacitors loss under high DC bias voltage and high current stress;ben-yaakov,0
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