Loss Characterization and Modeling of Class II Multilayer Ceramic Capacitors: A Synergistic Material-Microstructure-Device Approach-Reference-Cited by-同舟云学术

Loss Characterization and Modeling of Class II Multilayer Ceramic Capacitors: A Synergistic Material-Microstructure-Device Approach

Published:2023-11 Issue:11 Volume:38 Page:13535-13554
ISSN:0885-8993
Container-title:IEEE Transactions on Power Electronics
language:
Short-container-title:IEEE Trans. Power Electron.

Author:

Jiang Yunlei¹^ORCID,Hu Borong¹^ORCID,Shen Yanfeng²^ORCID,Ren Xufu¹^ORCID,Sandler Steve³^ORCID,Hofmann Stephan¹^ORCID,Long Teng¹^ORCID

Affiliation:

1. Electrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge, U.K.

2. Danfoss Silicon Power R&D Munich, Ismaning, Germany

3. Picotest, Phoenix, AZ, USA

Funder

Engineering and Physical Sciences Research Council

Jardine Foundation

Cambridge Trust

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/63/10261408/10153936.pdf?arnumber=10153936

Reference32 articles.

1. COSS Losses in 600 V GaN Power Semiconductors in Soft-Switched, High- and Very-High-Frequency Power Converters

2. Experimental evaluation of capacitors for high power resonant converters;vasic;Proc PCIM Europe Int Exhib Conf Power Electron Intell Motion Renewable Energy Manage,0

3. Methodology for Large-signal Loss Characterization of Ferroelectric Class II MLCC in High-frequency Range

4. Measurement of Large-Signal C OSS and C OSS Losses of Transistors Based on Nonlinear Resonance

5. Modeling ceramic capacitors loss under high DC bias voltage and high current stress;ben-yaakov,0

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