A Unified Capacitor Stress Emulation Method for High-Power Converter Applications

Author:

Yao Bo1ORCID,Wang Haoran2,Wang Qian3ORCID,Wang Huai1ORCID

Affiliation:

1. Department of Energy, Aalborg University, Aalborg, Denmark

2. Three Gorges Intelligent Industrial Control Technology Corporation, Ltd., Wuhan, China

3. School of Automation, Wuhan University of Technology, Wuhan, China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Reference30 articles.

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Failure mechanism of metallized film capacitors under DC field superimposed AC harmonic: From equipment to material;High Voltage;2024-05-28

2. Observations in Strain Sensing of Metallized Film Capacitors for AC filtering during Degradation;2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia);2024-05-17

3. Modeling and Optimization of Film Capacitor for Motor Controllers Considering the Distribution of Internal Loss;2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia);2024-05-17

4. Accelerated Degradation Testing and Failure Mechanism Analysis of Metallized Film Capacitors for AC Filtering;IEEE Transactions on Power Electronics;2024-05

5. A Mission Profile based Stress Emulation Method for Capacitors in High-power Converter Systems;2023 IEEE Energy Conversion Congress and Exposition (ECCE);2023-10-29

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