Author:
Scheick Leif,Guertin Steven,Nguyen Duc
Cited by
4 articles.
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1. DDR3 SDRAM Stuck/Weak Bit Studies and Mitigation;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03
2. Neutron-induced effects on a self-refresh DRAM;Microelectronics Reliability;2022-01
3. Impact of experimental conditions for the occurrence of stuck bits in commercial SDRAM;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09
4. Probing the Nature of Intermittently Stuck Bits in Dynamic RAM Cells;IEEE Transactions on Nuclear Science;2010-12