Study of gallium phosphate and langasite crystals and resonators by X-ray topography-Reference-Cited by-同舟云学术

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Study of gallium phosphate and langasite crystals and resonators by X-ray topography

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Container-title:Proceedings of IEEE 48th Annual Symposium on Frequency Control
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Author:

Capelle B.,Zarka A.,Detaint J.,Schwartzel J.,Ibanez A.,Philippot E.,Denis J.P.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx2/3175/9000/00398355.pdf?arnumber=398355

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measurement of the Second-Order Material Constants of Lanthanum-Gallium Tantalate (LGT) Through Ultrasound;IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control;2021-06

2. Growth and enhanced electro-elastic properties of Nd3+: CNGS crystals with ordered langasite structure;Materials Letters;2016-03

3. Crystal growth, experimental and theoretical studies on the electronic structure of CNGS and Nd:CNGS;CrystEngComm;2016

4. Growth and optical properties of a new CGG-type laser crystal Nd^3+:CNGS;Optical Materials Express;2015-04-07

5. Determination of the crystalline quality of the piezoelectric materials of class 32 using X-Ray topography;2008 IEEE International Frequency Control Symposium;2008-05

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