A Comparative Analysis of Analog Performances of Underlapped Dual Gate AlGaN/GaN Based MOS-HEMT and Schottky-HEMT

Author:

Mukherjee Hrit,Dasgupta Rajanya,Kar Mousiki,Kundu Atanu

Publisher

IEEE

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Comparative Study on the Effect of Dielectric Gate Materials on Analog and RF Performance of a Symmetrical Underlap DG Si/SiGe-based MOS-HEMT Device;2024 5th International Conference on Recent Trends in Computer Science and Technology (ICRTCST);2024-04-09

2. Influence of Device Length on Analog Performances of a Normally-Off Underlapped AlGaN/GaN-based Double Gate MOS-HEMT Device;2024 5th International Conference on Recent Trends in Computer Science and Technology (ICRTCST);2024-04-09

3. Influence of Buffer Length and Mole Fraction on Analog Performances of a Symmetrical Underlapped DG Si/SiGe-based MOS-HEMT Device;2024 IEEE 3rd International Conference on Control, Instrumentation, Energy & Communication (CIEC);2024-01-25

4. Analytical Comparison of Analog/RF Performance of DG InAlGaN/GaN based MOS-HEMTsfor GaN width variation;2023 IEEE 2nd International Conference on Industrial Electronics: Developments & Applications (ICIDeA);2023-09-29

5. Multigate MOS-HEMT;HEMT Technology and Applications;2022-06-24

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