Neutron degradation of the I-V characteristics of AlGaAs/GaAs modulation-doped field-effect transistors
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Published:1991-04
Issue:2
Volume:38
Page:858-860
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ISSN:0018-9499
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Container-title:IEEE Transactions on Nuclear Science
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language:
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Short-container-title:IEEE Trans. Nucl. Sci.
Author:
Krantz R.J.,Bloss W.L.,O'Loughlin M.J.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics