Single-Event Upsets Characterization & Evaluation of Xilinx UltraScale™ Soft Error Mitigation (SEM IP) Tool-Reference-Cited by-同舟云学术

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Single-Event Upsets Characterization & Evaluation of Xilinx UltraScale™ Soft Error Mitigation (SEM IP) Tool

Published:2016 Issue: Volume: Page:
ISSN:
Container-title:2016 IEEE Radiation Effects Data Workshop (REDW)
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Author:

Maillard Pierre,Hart Michael,Barton Jeff,Chang Paula,Welter Michael,Le Robert,Ismail Restu,Crabill Eric

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7886432/7891694/07891745.pdf?arnumber=7891745

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of the Xilinx SEM Core on a Zynq-Based Software-Defined Radio Under Proton Irradiation;2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC);2023-07

2. Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis;Microelectronics Reliability;2021-05

3. Leveraging the Openness and Modularity of RISC-V in Space;Journal of Aerospace Information Systems;2019-11

4. Heavy-Ion Induced Single Event Upsets in Advanced 65 nm Radiation Hardened FPGAs;Electronics;2019-03-14

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