Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs-Reference-Cited by-同舟云学术

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Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs

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Container-title:2004 IEEE International Reliability Physics Symposium. Proceedings
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Author:

Chatty K.,Cottrell P.,Gauthier R.,Muhammad M.,Stellari F.,Weger A.,Song P.,McManus M.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/9182/29131/01315313.pdf?arnumber=1315313

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