Nondestructive Measurement of Critical Current Distribution of SmBCO Coated Conductor Using Hall Probe-Reference-Cited by-同舟云学术

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Nondestructive Measurement of Critical Current Distribution of SmBCO Coated Conductor Using Hall Probe

Published:2010-06 Issue:3 Volume:20 Page:1537-1540
ISSN:1051-8223
Container-title:IEEE Transactions on Applied Superconductivity
language:
Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Ho-Sup Kim ,Sang-Soo Oh ,Nam-Jin Lee ,Seung-Kyu Baik ,Dong-Woo Ha ,Rock-Kil Ko ,Hong-Soo Ha ,Tae-Hyung Kim ,Do-Jun Youm ,Seung-Hyun Moon ,Chan Park

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/77/5471713/05443635.pdf?arnumber=5443635

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