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Field Decay and Snapback Measurements Using a Fast Hall Probe Sensor

  • Published:2004-06 Issue:2 Volume:14 Page:1822-1825
  • ISSN:1051-8223
  • Container-title:IEEE Transactions on Appiled Superconductivity
  • language:en
  • Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Pieloni T.,Sanfilippo S.,Bottura L.,Haverkamp M.,Tikhov A.,Effinger E.,Benedico E.,Smirnov N.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Computation of the Magnetization of Type II Superconductors for Potential Beam Screen Coatings of the Future Circular Collider;IEEE Transactions on Applied Superconductivity;2019-09

2. Active compensation of field errors within ±2ppm in superconducting magnets;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2011-05

3. The Development of Superconducting Magnets for Use in Particle Accelerators: From the Tevatron to the LHC;Reviews of Accelerator Science and Technology;2008-01

4. Field Quality Change in Accelerator Magnets Due to Re-Magnetization of Superconductor;IEEE Transactions on Applied Superconductivity;2006-06

5. A Hall Plate Based Instrument to Measure the Snapback in the Large Hadron Collider Superconducting Dipole Magnets;2006 IEEE Instrumentation and Measurement Technology Conference Proceedings;2006-04
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