Author:
Shepard K.L.,Narayanan V.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
26 articles.
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4. Impact of doping concentration on 1/fnoise performances of accumulation-mode Si(100) n-MOSFETs;Japanese Journal of Applied Physics;2016-03-08
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