A Study on ESD-CDM Cross-Power Domain Failures-Reference-Cited by-同舟云学术

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A Study on ESD-CDM Cross-Power Domain Failures

Published:2022-06-12 Issue: Volume: Page:
ISSN:
Container-title:2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME)
language:
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Author:

Dobre Mihaela-Daniela¹,Coll Philippe²,Brezeanu Gheorghe³

Affiliation:

1. Politehnica University,Microchip Technology Inc,Bucharest,Romania

2. Microchip Technology Inc,Rousset,France

3. Politehnica University,Bucharest,Romania

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9816371/9816743/09816786.pdf?arnumber=9816786

Reference12 articles.

1. CDM Protection Test Structure for I/O Cells in a Submicronic Technology;m-d;Electronics,2021

2. Stacking-MOS Protection Design for Interface Circuits Against Cross-Domain CDM ESD Stresses

3. Low-Leakage NMOS Clamps with Gate-Assisted Bipolar Triggering

4. JEDEC Solid State Technology Association,2009

5. Study on CDM ESD Robustness Among On-Chip Decoupling Capacitors in CMOS Integrated Circuits

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