Measurement Techniques for RF Nanoelectronic Devices: New Equipment to Overcome the Problems of Impedance and Scale Mismatch-Reference-Cited by-同舟云学术

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Measurement Techniques for RF Nanoelectronic Devices: New Equipment to Overcome the Problems of Impedance and Scale Mismatch

Published:2014-01 Issue:1 Volume:15 Page:30-39
ISSN:1527-3342
Container-title:IEEE Microwave Magazine
language:
Short-container-title:IEEE Microwave

Author:

Happy Henri,Haddadi Kamel,Theron Didier,Lasri Tuami,Dambrine Giles

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/6668/6717061/06717137.pdf?arnumber=6717137

Cited by 30 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Nanorobotics and Automatic On-Wafer Probe Station with Nanometer Positionning Accuracy;2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO);2023-06-28

3. Impedance Standard Substrate EM-Simulation for On-Wafer GSG Probing;2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO);2023-06-28

4. Design and Test of a New Dielectric-Loaded Resonator for the Accurate Characterization of Conductive and Dielectric Materials;Sensors;2023-01-03

5. Uncertainties Caused by Noise for Microwave Interferometric and Reflection Measurements of Extreme Reflection Coefficients;IEEE Transactions on Instrumentation and Measurement;2023

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