Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Applied Mathematics,Artificial Intelligence,Computational Theory and Mathematics,Computer Vision and Pattern Recognition,Software
Cited by
42 articles.
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1. Detection of Turned Features in an Autonomous Manner;Advances in Mechatronics and Mechanical Engineering;2024-04-19
2. A Semantic Feature Model in Concurrent Engineering;IEEE Transactions on Automation Science and Engineering;2010-07
3. A semantic feature language for concurrent engineering;2009 11th IEEE International Conference on Computer-Aided Design and Computer Graphics;2009-08
4. Paradigm shift: unified and associative feature-based concurrent and collaborative engineering;Journal of Intelligent Manufacturing;2008-06-13
5. Associations in a Unified Feature Modeling Scheme;Journal of Computing and Information Science in Engineering;2006-02-14