Heavy Ion Induced Single Event Effects Characterization of the XQE-0920 Commercial Off-the-shelf CMOS Photonic Imager Microcircuit-Reference-Cited by-同舟云学术

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Heavy Ion Induced Single Event Effects Characterization of the XQE-0920 Commercial Off-the-shelf CMOS Photonic Imager Microcircuit

Published:2021-07 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)
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Author:

Koga R.,Davis S.,Berman A.,Mabry D.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9679321/9679322/09679348.pdf?arnumber=9679348

Reference10 articles.

1. Image Lag Analysis and Photodiode Shape Optimization of 4T CMOS Pixels;xu;Proceedings of the International Image Sensor Workshop,0

2. SEE Testing of National Semiconductor's LM98640QML System on a Chip for Focal Plane Arrays and Other Imaging Systems

3. Selectable Fluence Accuracy at the BASE Heavy Ion Facility

4. SiOnyx XQE-0920 720p 1/2;CMOS Image Sensor,0

5. Radiation effects on photonic imagers-a historical perspective

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