Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/7217973/7229816/07229849.pdf?arnumber=7229849
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. SPRED: Spatially Distributed Laser Fault Injection Resilient Design;2023 24th International Symposium on Quality Electronic Design (ISQED);2023-04-05
2. A Sense Amplifier Based Bulk Built-In Current Sensor for Detecting Laser-Induced Currents;2023 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID);2023-01
3. Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron-Induced Transients;IEEE Transactions on Nuclear Science;2020-07
4. An IC-level countermeasure against laser fault injection attack by information leakage sensing based on laser-induced opto-electric bulk current density;Japanese Journal of Applied Physics;2020-02-28
5. On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits;2020
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