Analysis of radiation-induced cross domain errors in TMR architectures on SRAM-based FPGAs
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx7/8030509/8046164/08046214.pdf?arnumber=8046214
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. AnoDe: A Log-based Self-Supervised Framework to Detect Scrubber Failures in SRAM-FPGA;2022 IEEE 27th Pacific Rim International Symposium on Dependable Computing (PRDC);2022-11
2. Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs;Microelectronics Reliability;2022-11
3. LFTSM: Lightweight and Fully Testable SEU Mitigation System for Xilinx Processor-Based SoCs;2020 30th International Conference on Field-Programmable Logic and Applications (FPL);2020-08
4. Mitigating single event upset method for Zynq MPSoC;Microelectronics Reliability;2019-09
5. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA;IEEE Transactions on Nuclear Science;2019-07
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