Analyses of 5σ V<inf>th</inf> fluctuation in 65nm-MOSFETs using takeuchi plot-Reference-Cited by-同舟云学术

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Analyses of 5σ Vth fluctuation in 65nm-MOSFETs using takeuchi plot

Published:2008-06 Issue: Volume: Page:
ISSN:
Container-title:2008 Symposium on VLSI Technology
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Author:

Tsunomura T.,Nishida A.,Yano F.,Putra A.T.,Takeuchi K.,Inaba S.,Kamohara S.,Terada K.,Hiramoto T.,Mogami T.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4573020/4588540/04588600.pdf?arnumber=4588600

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