Embedded STT-MRAM in 28-nm FDSOI Logic Process for Industrial MCU/IoT Application-Reference-Cited by-同舟云学术

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Embedded STT-MRAM in 28-nm FDSOI Logic Process for Industrial MCU/IoT Application

Published:2018-06 Issue: Volume: Page:
ISSN:
Container-title:2018 IEEE Symposium on VLSI Technology
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Author:

Lee Yong Kyu,Jung Hyunsung,Lee Kilho,Shin HyunChul,Jung Hyuntaek,Pyo Mark,Antonyan Artur,Lee Daesop,Hwang Sohee,Jang Daehyun,Ji Yongsung,Song Yoonjong,Lee Seungbae,Lim Jungman,Koh Kwan-Hyeob,Hwang Kihyun,Hong Hyeongsun,Park Kichul,Jeong Gitae,Yoon Jong Shik,Jung E.S.,Kim JooChan,Oh SeChung,Bae Byoung-Jae,Lee SangHumn,Lee JungHyuk,Pi UngHwan,Seo Boyoung

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8481640/8510617/08510623.pdf?arnumber=8510623

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