Author:
Zafar S.,Kim Y.,Narayanan V.,Cabral C.,Paruchuri V.,Doris B.,Stathis J.,Callegari A.,Chudzik M.
Cited by
30 articles.
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3. BTI Aging Influence in SRAM-based In-Memory Computing Schemes and its Mitigation;2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2023-12-04
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5. Multi-physics Simulations for Nanoscale CMOS Reliability;2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2023-09-27