Surface Layer Analysis of a 28Si-Enriched Sphere Both in Vacuum and in Air by Ellipsometry-Reference-Cited by-同舟云学术

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Surface Layer Analysis of a 28Si-Enriched Sphere Both in Vacuum and in Air by Ellipsometry

Published:2017-06 Issue:6 Volume:66 Page:1283-1288
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Fujita Kazuaki,Kuramoto Naoki,Azuma Yasushi,Mizushima Shigeki,Fujii Kenichi

Funder

Grant-in-Aid for Scientific Research (B) from the Japan Society for the Promotion Science

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/7924433/07801824.pdf?arnumber=7801824

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Realization of the New Kilogram Based on the Planck Constant by the X-Ray Crystal Density Method;Handbook of Metrology and Applications;2023

3. Realization of the New Kilogram Based on the Planck Constant by the X-Ray Crystal Density Method;Handbook of Metrology and Applications;2022

4. Realization of the new kilogram by the XRCD method using 28Si-enriched spheres;Measurement: Sensors;2021-12

5. New Definitions of the Kilogram and the Mole: Paradigm Shift to the Definitions Based on Physical Constants;Analytical Sciences;2021-01-10

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