A Equivalent Circuit for Rapid Reproduction of IGBT Transient Thermal Impedance Graph

Author:

Liang Yingzong1,Chen Yanning1,Zhao Dongyan1,Shao Yali1,Liu Fang1,Xiao Chao1,Li Yongfu2

Affiliation:

1. Beijing Smart-Chip Microelectronics Technology Co., Ltd,State Grid Key Laboratory of Power Industrial Chip Reliability Technology,Beijing,China

2. State Grid Chongqing Electric Power Company Electric Power Research Institute,Chongqing,China

Publisher

IEEE

Reference10 articles.

1. Thermal network parameter identification of IGBT module based on the cooling curve of junction temperature

2. Simulation vs. measurement of transient thermal resistance Zth of power modules and its effect on lifetime prediction;thoben;PCIM Europe International Exhibition and Conference for Power Electronics Intelligent Motion Renewable Energy and Energy Management,0

3. From vehicle drive cycle to reliability testing of Power Modules for hybrid vehicle inverter;thoben;Proceedings of PCIM Nuremberg,0

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