An Aging Small-signal Modeling Method of Microwave Transistors Using GA-ELM Neural Network
Author:
Affiliation:
1. School of Microelectronics, Xidian University,Xi'an,China,710071
2. Nanjing Electronic Devices Institute,Science and Technology on Monolithic Integrated Circuits and Modules Laboratory,Nanjing,China,210016
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10218344/10218369/10218508.pdf?arnumber=10218508
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1. Ambient Temperature-Induced Device Self-Heating Effects on Multi-Fin Si n-FinFET Performance
2. Fully Analytical Carrier-Based Charge and Capacitance Model for Hetero-Gate-Dielectric Tunneling Field-Effect Transistors
3. A new Inter-electrode coupling capacitance extraction method for deep-submicron AlGaN/GaN HEMTs
4. Power-Aware Testing for Maximum Fault Coverage in Analog and Digital Circuits Simultaneously;singh;IETE Technical Review,2021
5. Hetero-Interfacial Thermal Resistance Effects on Device Performance of Stacked Gate-All-Around Nanosheet FET
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