Surface Reflectivity Measurements of Sub-Millimeter Wave Reflector Antenna Using a Quasi-Optical Test Bench-Reference-Cited by-同舟云学术

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Surface Reflectivity Measurements of Sub-Millimeter Wave Reflector Antenna Using a Quasi-Optical Test Bench

Published:2023-12-11 Issue: Volume:47 Page:1-4
ISSN:
Container-title:2023 IEEE Microwaves, Antennas, and Propagation Conference (MAPCON)
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Author:

Solanki Anil L.¹,Sharma Arun Kumar¹,Tyagi Yogesh¹,Upadhyay Gaurav¹,Dey Ranajit¹,Singh V.K.¹,Kulshrestha Sanjeev¹,Mahajan M.B.¹

Affiliation:

1. Antenna Systems Area Space Applications Centre (ISRO),Ahmedabad,India,380015

Funder

Space Applications Centre

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10463756/10463710/10463985.pdf?arnumber=10463985

Reference6 articles.

1. The measurement of the properties of materials

2. DIELECTRIC PROPERTIES MEASUREMENT TECHNIQUES AND APPLICATIONS

3. An Overview Of Dielectric Properties Measuring Techniques[J];Venkatesh M;Canadian Biosystems Engineering,2005

4. A modified time-domain gating calibration method for free-space material measurement

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