Optical Super-resolution Diagnostics: A Review of Sub-wavelength Measurements and Applications-Reference-Cited by-同舟云学术

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Optical Super-resolution Diagnostics: A Review of Sub-wavelength Measurements and Applications

Published:2023-07-31 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
language:
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Author:

Bryanston-Cross Peter¹,Judge Thomas²,Wang Zuobin³

Affiliation:

1. School of Engineering University of Warwick UK, Centre for Nano Metrology Changchun University China

2. Video and Imaging Research IWAHDK LTD,UK

3. Changchun University of Science and Technology,International Research Centre for Nano Handling and Manufacturing of China,Changchun,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10305274/10305299/10305320.pdf?arnumber=10305320

Reference47 articles.

1. Microscopy by reconstructed wave-fronts;gabor;Proceedings of the Royal Society A,1949

2. Fourier ptychographic microscopy reconstruction with multiscale deep residual network

3. Hyperspectral microscopy imaging based on Fourier ptychographic microscopy

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