A Built-Off Self-Repair Scheme for Channel-Based 3D Memories-Reference-Cited by-同舟云学术

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A Built-Off Self-Repair Scheme for Channel-Based 3D Memories

Published:2017-08-01 Issue:8 Volume:66 Page:1293-1301
ISSN:0018-9340
Container-title:IEEE Transactions on Computers
language:
Short-container-title:IEEE Trans. Comput.

Author:

Liu Hsuan-Hung,Lin Bing-Yang,Wu Cheng-Wen,Chiang Wan-Ting,Mincent Lee,Lin Hung-Chih,Peng Ching-Nen,Wang Min-Jer

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Link

http://xplorestaging.ieee.org/ielx7/12/7972690/07850958.pdf?arnumber=7850958

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Efficient Repair Analysis Algorithm Exploration for Memory With Redundancy and In-Memory ECC;IEEE Transactions on Computers;2021-05-01

2. Effective Spare Line Allocation Built-in Redundancy Analysis With Base Common Spare for Yield Improvement of 3D Memory;IEEE Access;2021

3. A Novel Built-In Self-Repair Scheme for 3D Memory;IEEE Access;2019

4. An Area-Efficient BIRA With 1-D Spare Segments;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2018-01

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