Density Functional Theory Based Monte Carlo Simulations for Prediction of Secondary Electron Yield from Metal Oxides-Reference-Cited by-同舟云学术

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Density Functional Theory Based Monte Carlo Simulations for Prediction of Secondary Electron Yield from Metal Oxides

Published:2023-05-21 Issue: Volume: Page:1-1
ISSN:
Container-title:2023 IEEE International Conference on Plasma Science (ICOPS)
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Author:

Gutierrez R. E.¹,Matanovic I.²,Polak M.³,Morgan D.³,Booske J.³,Schamiloglu E.¹

Affiliation:

1. University of New Mexico,Department of Electrical and Computer Engineering,Albuquerque,New Mexico,United States of America

2. University of New Mexico,Department of Chemical and Biological Engineering,Albuquerque,New Mexico,United States of America

3. University of Wisconsin-Madison,Department of Materials Science and Engineering,Madison,Wisconsin,United States of America

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10480908/10480921/10481463.pdf?arnumber=10481463

Reference1 articles.

1. MAST-SEY: MAterial Simulation Toolkit for Secondary Electron Yield. A monte carlo approach to secondary electron emission based on complex dielectric functions

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