Electromagnetic Shock-Induced Current Due to Charge Impact on a Conductor-Reference-Cited by-同舟云学术

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Electromagnetic Shock-Induced Current Due to Charge Impact on a Conductor

Published:2022-05-22 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Conference on Plasma Science (ICOPS)
language:
Short-container-title:

Author:

Li D.¹,Wong P.²,Chernin D.³,Lau Y. Y.¹

Affiliation:

1. University of Michigan,Department of Nuclear Engineering and Radiological Sciences,Ann Arbor,Michigan,United States of America

2. Michigan State University,Department of Electrical and Computer Engineering,East Lansing,Michigan,United States of America

3. Leidos Inc.,Reston,Virginia,United States of America

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9812948/9812949/09813056.pdf?arnumber=9813056

Reference4 articles.

1. Theory, simulation, and experiments on a magnetically insulated line oscillator (MILO) at 10 kA, 240 kV near Hull cutoff condition

2. The effects of multipactor on the quality of a complex signal propagating in a transmission line

3. Proc. IRE 27, 584 (1939); W. Shockley;ramo;J Appl Phys,1938

4. A Relativistic and Electromagnetic Correction to the Ramo–Shockley Theorem

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