A Review: Custard Apple Leaf Parameter Analysis and Leaf Disease Detection using Digital Image Processing-Reference-Cited by-同舟云学术

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A Review: Custard Apple Leaf Parameter Analysis and Leaf Disease Detection using Digital Image Processing

Published:2019-03 Issue: Volume: Page:
ISSN:
Container-title:2019 3rd International Conference on Computing Methodologies and Communication (ICCMC)
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Author:

Gargade Appasaheb,Khandekar S.A.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8811524/8819605/08819867.pdf?arnumber=8819867

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Leaf Diseases Detection using Android Kotlin App with Deep Learning Algorithm;2024 5th International Conference for Emerging Technology (INCET);2024-05-24

2. A Lightweight Deep Learning Semantic Segmentation Model for Optical-Image-Based Post-Harvest Fruit Ripeness Analysis of Sugar Apples (Annona squamosa);Agriculture;2024-04-08

3. Neem Leaf Disease Detection based on Enhanced Leaky Capacitor-Fired Neuron (LCFN) Model;2024 Ninth International Conference on Science Technology Engineering and Mathematics (ICONSTEM);2024-04-04

4. Apple Leaf Disease Recognition Based on Optoelectronic Time-Delay Reservoir Computing;IEEE Access;2024

5. An Efficient Deep Transfer Learning based Apple Leaf Disease Classification;2023 26th International Conference on Computer and Information Technology (ICCIT);2023-12-13

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