Reliability Assurance for Deep Neural Network Architectures Against Numerical Defects
Author:
Affiliation:
1. University of Illinois Urbana-Champaign,Department of Computer Science
2. University of Wisconsin-Madison,Department of Computer Sciences
3. School of Computer Science, Peking University
Funder
National Natural Science Foundation of China
National Key Research and Development Program of China
Innovation and Technology Commission of HKSAR
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10172484/10172342/10172602.pdf?arnumber=10172602
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