Nonlinear Analysis of Electroencephalogram Variability as a Measure of the Depth of Anesthesia-Reference-Cited by-同舟云学术

Nonlinear Analysis of Electroencephalogram Variability as a Measure of the Depth of Anesthesia

Published:2022 Issue: Volume:71 Page:1-13
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Chen Yi-Feng¹^ORCID,Fan Shou-Zen²^ORCID,Abbod Maysam F.³^ORCID,Shieh Jiann-Shing⁴^ORCID,Zhang Mingming⁵^ORCID

Affiliation:

1. Academy for Advanced Interdisciplinary Studies, Southern University of Science and Technology, Shenzhen, China

2. Department of Anesthesiology, En Chu Kong Hospital, New Taipei City, Taiwan

3. College of Engineering, Design and Physical Sciences, Brunel University London, Uxbridge, U.K.

4. Department of Mechanical Engineering, Yuan Ze University, Taoyuan, Taiwan

5. Department of Biomedical Engineering, Shenzhen Key Laboratory of Smart Healthcare Engineering, Southern University of Science and Technology, Shenzhen, China

Funder

National Natural Science Foundation of China

Shenzhen Key Laboratory of Smart Healthcare Engineering

Ministry of Science and Technology, Taiwan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/9717300/09759324.pdf?arnumber=9759324

Reference51 articles.

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3. On the Behavior of MEMD in Presence of Multivariate Fractional Gaussian Noise

4. A study of the characteristics of white noise using the empirical mode decomposition method

5. Characterizing Awake and Anesthetized States Using a Dimensionality Reduction Method

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