Author:
Cen Kong,Jianjun Zhou,Yuechan Kong,Kai Zhang,Tangsheng Chen
Cited by
6 articles.
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1. An Approach to GaN HEMT Modeling Based on Genetic Algorithm;2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS);2023-11-27
2. Analysis of the Stress Wave Characteristic Parameter of Cascode GaN HEMT;IEEE Sensors Journal;2022-11-01
3. Single-Event Multiple Effect Tolerant RHBD14T SRAM Cell Design for Space Applications;IEEE Transactions on Device and Materials Reliability;2021-03
4. Assembly Challenge and Solution for GaN on Si substrate;2019 14th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT);2019-10
5. Analysis of Parallel Operation of 4H-SiC GTOs;2019 IEEE 3rd International Electrical and Energy Conference (CIEEC);2019-09